Run to align signal arrival times precisely at the DIB contact points. Step 3: Loading and Running the Test Program Load the compiled test method software modules. Load the Pin Map, Levels, Timing, and Vector Pattern files.
Uses an object-oriented, database-driven architecture. Test programs are built using isolated, reusable components, making it highly efficient for multi-site and concurrent testing. Key Configuration Elements Detailed in the Manual
To help me tailor any specific sections or provide code examples, let me know:
The Advantest V93000 is a modular test system designed for both engineering characterization and high-volume manufacturing (HVM). Its scalable architecture allows users to configure the tester from a smaller, cost-effective setup to a massive, high-pin-count configuration. advantest 93k tester manual
If you search for "Advantest 93K tester manual," you won’t find a single PDF. Instead, look for these core volumes:
Houses the water-cooled instrumentation cards. It connects directly to the prober (for wafer test) or the handler (for package test) via a dedicated device interface board (DIB).
These guides focus on test program generation and execution. Run to align signal arrival times precisely at
The system is controlled by the software, which resides within an Eclipse-based integrated development environment (IDE).
Multi-threaded, highly parallel execution optimized for high-site-count testing. Programming Language: Test methods are written in Java .
The Advantest V93000 (93K) is a powerful, scalable SoC tester, but its official documentation—spanning thousands of pages—can be overwhelming. Whether you're debugging a pattern, setting up timing, or optimizing a datalog, knowing how to use the manual effectively saves hours of frustration. Uses an object-oriented, database-driven architecture
: This is the primary application for viewing and searching V93000 documentation, including the DUT Board Design Guide .
Contains the raw digital truth table (0s, 1s, Xs, and Ls) executed cycle-by-cycle to exercise the DUT's logic. 1 or 0 : Drive High or Low. H or L : Expect/Compare High or Low. X : Ignore the output on this cycle. 4. Manual Execution Workflow: Running a Test Step-by-Step
The physical structure containing the instrument slots. It rotates and docks directly onto wafer probers or package handlers.
Full documentation packages can be downloaded from the Software Center. If you don't have access, you must log in to the myAdvantest portal and submit a request under Self Services > Software Center > Request . Key Manuals and Documentation Types
To help find more specific information from the manual, could you share (SmarTest 7 or SmarTest 8) you are using, or what specific test type (like digital, RF, or DC parametrics) you need to set up? Share public link